National Instruments has introduced the NI PXIe-1066DC 18-slot chassis, which adds high-availability features to the PXI Express platform to maximize system uptime. These features improve the system-level mean time before failure (MTBF) and mean time to repair (MTTR) of PXI systems in many demanding, mission-critical test, measurement and control applications. The chassis adds critical component redundancy and remote monitoring to the uptime-focused capabilities of existing NI PXI instrumentation.
Dr. Tom Bradicich, R&D Fellow, National Instruments & Former VP, Systems Technology, IBM said, “The NI PXIe-1066DC chassis builds on the long-standing leadership of the PXI standard for mission-critical projects. This new chassis illustrates NI’s continued commitment to superior reliability, availability, serviceability and manageability when system uptime is paramount.”
