National Instruments (NI) has announced the NI PXIe-1435 high-performance Camera Link frame grabber. Engineers can use the new module to integrate high-speed and high-resolution imaging into their PXI systems, the industry standard for automated test with more than 1,500 measurement modules available from more than 70 vendors. By combining high-throughput imaging with the benefits of off-the-shelf PXI measurement hardware, NI now offers full software-defined solutions for demanding automated test applications in industries such as consumer electronics, automotive and semiconductor.
Engineers can power cameras through Power over Camera Link (PoCL)-enabled cables, eliminating the need for additional wires in deployment environments. The frame grabber also offers 512MB of DDR2 onboard acquisition memory for added reliability in transferring large images without fear of data overflow. Onboard digital I/O includes four bidirectional transistor-transistor logic (TTL), two opto-isolated inputs and one quadrature encoder for triggering and communicating inspection results with automation devices.
The frame grabber incorporates the synchronization, timing, data streaming and processing capabilities of the PXI Express specification, and supports image processing on complementary field-programmable gate array (FPGA) boards to further boost system performance.
“The NI PXIe-1435 frame grabber further complements our capabilities in the PXI platform,” said Matt Friedman, National Instruments Senior Product Manager for the PXI platform and PXISA board member. “The addition of high-performance imaging to our PXI offerings enhances our mixed-signal capabilities for high-end test systems.”
