NI has successfully hosted the 13th edition of NIDays - an annual conference on graphical system design - in Bangalore. The event was attended by over 500 engineers, scientists, and experts from industry and academia who discussed the trends, opportunities and challenges that lie in the future of connected systems.
At the seminar, NI India launched the latest version of its flagship product, LabVIEW 2016, with enhancements in acquiring, processing and managing data from remote data acquisition systems. NIDays offered 21 technical sessions and tutorials along with a wide range of products and application demonstrations. Speakers and exhibitors from various industries joined the event. The diverse set of panellists shared their ideas on trends in communication systems, embedded electronics, security and automated test systems that address the challenges and opportunities for the next generation of connected systems.
Jayaram Pillai, Managing Director - IndRAA, National Instruments, said, "Over the last 18 years in India, we have built a strong ecosystem of partners, proficient developers and successful customers and this ecosystem has enabled our customers to innovate. It is inspiring to see the amount of innovation and true technological advancements at this year’s NIDays. The continuous dedication and leadership I’ve seen from the engineering community is awe-inspiring and I’m excited for the future of engineering."
NI’s tools have proven to be instrumental in the success of a lot of Indian customers and their applications. This year, NI added various new products to the list of these tools aimed at accelerating the productivity of engineers and researchers working in the areas of IoT, 5G, industrial automation, etc. Some of these tools enable applications that previously seemed too ambitious because of their complexities.
The new range of products launched at the event includes:
• High-performance PXI instrumentation for processing and sensing at the edge • MIMO Application Framework which provides wireless researchers with a fully open reference solution to accelerate 5G prototyping • Early access technology platform for TSN which delivers mechanisms to create distributed, synchronized, hard real-time systems over standard Ethernet • NI Hardware-in-the-Loop (HIL) Simulator which helps drive down the cost of test for customers • Software-centric NI PXI Digital Pattern Instrument used by semiconductor characterization and production test engineers to drive down the cost of their tests and ensure product quality.
